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Verify · Reference TST-002 · Technical review:

How to Measure DCIR Correctly

A valid DCIR result is a reproducible current-step response with defined preparation, sensing, timing and calculation.

Start with the decision ↓

The engineering decision

Freeze the complete DCIR procedure before setting acceptance limits or comparing cells, batches or suppliers.

Have these inputs ready

  • Cell identity and prior history
  • SOC-setting and temperature-stabilization method
  • Pulse amplitude, direction and duration
  • Four-wire fixture and acquisition limits

Separate force and sense connections

Scroll horizontally to view the full diagram →

Separate force and sense connectionsSchematic four-wire connection. Sense contacts are on the cell side of force contacts; resistance inside the sense boundary remains included. Force +; Force −; Cell terminals; Sense +; Sense −Current sourceand loadCell under testVoltmeterForce +Force −Sense +Sense − · negligible input current
Schematic four-wire connection. Sense contacts are on the cell side of force contacts; resistance inside the sense boundary remains included.

Define the test before collecting values

Record cell identity, history, SOC method, temperature, stabilization, rest, pulse direction, amplitude, duration, voltage windows, sample rate, filtering, fixture and calculation.

An acceptance limit belongs to that frozen procedure. A changed fixture, timing or SOC method requires correlation before the same limit is reused.

Sense voltage at the intended boundary

Use separate current-force and voltage-sense conductors. Place the sense points at the terminals whose resistance is intended to be included.

Cell-terminal, module-terminal and pack-output measurements answer different questions. Label the boundary in the result.

References: Keysight: How to Test Coin Cell Batteries

Use synchronized current and voltage

Use discharge-positive current: discharge I > 0, charge I < 0. Define t0 from the measured transition, not just the command. State the pre-transition baseline and synchronized voltage/current sample windows.

The numerator is a voltage drop, Vbaseline − V(t). For a normal charge pulse both numerator and denominator are negative, giving positive resistance. A near-zero current step makes the ratio unusable.

Record the trigger rule, rise time, window width, sample rate and filtering. End-of-pulse samples must precede the falling edge. Early readings can be unresolved; longer pulses include polarization and state changes.

R(t) = [Vbaseline − V(t)] / [I(t) − Ibaseline]

References: Comparison of Several Methods for Determining the Internal Resistance of Lithium Ion Cells

Reject common measurement shortcuts

Do not use two-wire voltage, unspecified tester-reported timing, unmatched temperatures or mixed charge/discharge direction. Do not average an unstable fixture into a precise-looking number.

Report uncertainty and only the digits supported by the equipment and repeatability study.

Worked discharge and charge examples

Illustrative data, not test results or recommended settings: assume 50% SOC, stabilized 25°C and prescribed rest. Define t0 at the measured step midpoint, baseline averaging from −100 to −10 ms, and loaded windows at 90–100 ms or 990–1000 ms. Verify the tester settles before the windows.

At 1 s, the discharge example gives 0.250 V / 50.0 A = 5.00 mΩ. The separate charge example uses its own prepared state and baseline.

Illustrative samples with discharge-positive currentScroll horizontally to compare all columns →
PointVoltageCurrentResistance
Discharge baseline3.300 V0.0 AReference
Discharge at 100 ms3.100 V+50.0 A4.00 mΩ
Discharge at 1 s3.050 V+50.0 A5.00 mΩ
Separate charge baseline3.300 V0.0 AReference
Charge at 1 s3.450 V−30.0 A5.00 mΩ

Carry uncertainty through the ratio

Illustrative independent standard uncertainties u(ΔV) = 2 mV and u(ΔI) = 0.2 A give u(R) ≈ 0.045 mΩ at 0.250 V and 50.0 A. With k = 2 the expanded estimate is approximately 0.09 mΩ.

The resulting 5.00 ± 0.09 mΩ (k = 2) applies only to that assumed budget. Include actual correlations, timing, temperature, SOC preparation and fixture repeatability. Uncertainty of a difference is not automatically uncertainty of one reading.

u(R) / R ≈ √[(u(ΔV) / ΔV)² + (u(ΔI) / ΔI)²]

References: NIST: Metrology and process control, dealing with measurement uncertainty

Set abort limits before applying current

Use qualified personnel, a rated protected fixture and cell-specific voltage, current and temperature limits. Define abort conditions and safe isolation in the approved test plan.

Stop on a breached limit, unstable connection, unexpected heating, swelling, leakage or equipment fault. A clipped, tapered or interrupted pulse is not a full-amplitude acceptance sample. Do not override protection to complete the test.

Measurement & validation procedure

Application acceptance checklistScroll horizontally to compare all columns →
Test / reviewRecordAcceptance condition
Prepare and stabilize the cellIdentity, history, SOC, temperature and restPreparation matches the frozen procedure
Apply and record the pulseRaw synchronized current and four-wire voltage traceTransition and sample rate resolve every declared timestamp
Calculate and repeatDCIR values, uncertainty and fixture checkRepeatability supports the intended acceptance limit

Continue this engineering task

Related engineering guidance

Prepare the evidence for review

  • Frozen DCIR procedure
  • Fixture and sense-point drawing
  • Raw synchronized traces
  • Repeatability, uncertainty and acceptance analysis
Continue to engineering review

Technical sources & claim support

References support the stated engineering principles. Worked examples use their explicitly stated assumptions.

  1. A study of the influence of measurement timescale on internal resistance characterisation methodologies for lithium-ion cells ↗

    Scientific Reports 8, 21 (2018); abstract and Figure 7: comparison at matched measurement timescales

    Peer-reviewed cell study. Numerical values apply only to the tested cells, SOC, temperature and equipment.

  2. Comparison of Several Methods for Determining the Internal Resistance of Lithium Ion Cells ↗

    Sections 4–5: DC step, AC resistance, impedance spectroscopy and pulse-duration effects

    Peer-reviewed method comparison. The proposed timing and cell values are not universal acceptance requirements.

  3. Keysight: How to Test Coin Cell Batteries ↗

    Coin Cell Battery Testing and Modeling: four-wire sensing, pulse resistance, pulse width/rest time and defined cutoffs

    Measurement principles illustrated with coin cells. Select the current profile, fixture, sampling, temperature and cutoff conditions for the actual cell or pack.

  4. NIST: Metrology and process control, dealing with measurement uncertainty ↗

    Measurement uncertainty and manufacturing risk

    Basis for considering uncertainty in acceptance decisions.

Key claims and evidence
Evidence mappingScroll horizontally to compare all columns →
ClaimBasisReference
Pulse timing and acquisition response affect calculated DCIRdocumentationA study of the influence of measurement timescale on internal resistance characterisation methodologies for lithium-ion cells; Comparison of Several Methods for Determining the Internal Resistance of Lithium Ion Cells
Four-wire connection separates voltage sensing from current leadsdocumentationKeysight: How to Test Coin Cell Batteries
The stated procedure is a reproducibility workflow, not a universal acceptance limitworkflowengineering workflow
Resistance and uncertainty examples are calculations with hypothetical inputscalculationcalculation
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